{"id":2,"date":"2015-11-15T04:02:58","date_gmt":"2015-11-15T04:02:58","guid":{"rendered":"http:\/\/sites.ieee.org\/sagroups-template\/?page_id=2"},"modified":"2020-02-06T21:56:30","modified_gmt":"2020-02-06T20:56:30","slug":"home","status":"publish","type":"page","link":"https:\/\/sagroups.ieee.org\/2822\/","title":{"rendered":""},"content":{"rendered":"<p><b>Sponsoring Society and Committee:\u00a0<\/b>IEEE Microwave Theory and Techniques Society\/Standards\u00a0 Committee (MTT\/SC)<\/p>\n<p><b>Title:<\/b>Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements<\/p>\n<p><b>Scope: <\/b>This Recommended Practice describes best-practice procedures for performing accurate on-wafer calibrations, de-embedding and measurements at microwave, millimeter-wave and THz frequencies. Recommendations are given for designing and performing both accurate on-wafer calibrations in coplanar waveguide and microstrip lines fabricated directly on a user&#8217;s wafer and off-wafer &#8220;probe-tip&#8221; working calibrations.<\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Sponsoring Society and Committee:\u00a0IEEE Microwave Theory and Techniques Society\/Standards\u00a0 Committee (MTT\/SC) Title:Recommended Practice for Microwave, Millimeter-wave and THz On-Wafer Calibrations, De-Embedding and Measurements Scope: This Recommended Practice describes best-practice procedures [&hellip;]<\/p>\n","protected":false},"author":3,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"tpl-sidebar-page.php","meta":{"footnotes":""},"class_list":["post-2","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/sagroups.ieee.org\/2822\/wp-json\/wp\/v2\/pages\/2","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sagroups.ieee.org\/2822\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sagroups.ieee.org\/2822\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sagroups.ieee.org\/2822\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/sagroups.ieee.org\/2822\/wp-json\/wp\/v2\/comments?post=2"}],"version-history":[{"count":0,"href":"https:\/\/sagroups.ieee.org\/2822\/wp-json\/wp\/v2\/pages\/2\/revisions"}],"wp:attachment":[{"href":"https:\/\/sagroups.ieee.org\/2822\/wp-json\/wp\/v2\/media?parent=2"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}