The 3rd Working Group meeting
The 3rd Working Group meeting of IEEE P2870-Grip Test Method Guide for Fittings of High-Temperature, Low-Sag Overhead Conductor Under Tension and Electric Current Co-effect will be held on November 21, […]
The 3rd Working Group meeting of IEEE P2870-Grip Test Method Guide for Fittings of High-Temperature, Low-Sag Overhead Conductor Under Tension and Electric Current Co-effect will be held on November 21, […]
The kick-off meeting of IEEE P2870-Grip Test Method Guide for Fittings of High-Temperature, Low-Sag Overhead Conductor Under Tension and Electric Current Co-effect will be held on Sep 5,2020 in Shanghai, […]
The kick-off meeting of IEEE P2870-Grip Test Method Guide for Fittings of High-Temperature, Low-Sag Overhead Conductor Under Tension and Electric Current Co-effect will be held on June 6, 2020 in […]