Scope: 

The analog/mixed-signal portion of the industry has the same needs for test portability and re-use which drove the development of IEEE1687 for the digital community. Standard languages for analog test access and content description which facilitate easier and more precise communication between IC designers, test engineers, instrument developers, and EDA tool developers should result in a reduction in DfT/test development effort and implementation time. Specifically, as has been seen from IEEE 1687 for digital circuits, expanding ICL and PDL to analog/mixed-signal circuits should provide these benefits:

• Test patterns that are portable from design to design can be created in PDL
•  Portable IP-level tests can be retargeted through SOC-specific networks described in ICL to higher levels in the design
• Control of analog test bus (ATB) structures can be done using automated retargeting of PDL procedures instead of bit-bashing.

There are several benefits from standardizing analog test access and control description:

• Uniform description across the industry for analog test access, control, signals, instruments, and tests
• Clear, unambiguous communication of test intent
• Automated retargeting of analog/mixed-signal tests built on existing 1687 tools with extensions of ICL and PDL
• A systematic description that facilitates automation for analog/mixed-signal DfT

To view the submitted PAR to NESCOM of the IEEE, click here -> Link to P1687.2 PAR

Interested in joining the group ? Or just want to request basic information about this groups activities ?

Email the team by clicking -> here