IEEE P2427 Working Group Webpage

Scope:  

Unlike for digital circuits, the industry lacks a standardized way to specify the coverage of tests for analog and mixed-signal circuits. This omission has led to, at best, the use of incompatible ad hoc definitions or, at worst, no quantitative consideration of analog defect coverage at all. The anticipated benefits of using this standard include the following:

  •  Definition of a defect universe for a given analog circuit (schematic or layout netlist)
    • A list of defect types and their typical root causes
    • A practical, realistic model for each defect type
    • Equivalent defects that facilitate defect collapsing and simulating fewer defects
  • Standard test coverage metrics for analog / mixed-signal circuits
    • A clear definition of defect detection criteria
    • A clear definition of defect coverage whereby different tools should give the same coverage for a given circuit and test
  • Requirements for analog defect simulators; standard ways to automatically
    • Inject standard defects
    • Measure the ability of the tests to detect standard defects in circuit elements
    • List undetected defects
    • Report coverage of a circuit by a set of tests in an objective, traceable way
  • A feedback mechanism (i.e., coverage measurement) that allows
    • Creation of higher coverage tests, for a defined set of defects (and likely others too)
    • Reduction of test time without reducing test coverage
  • A more deterministic way to estimate DPPM for ICs containing analog circuitry
    • Based on defect coverage, accounting for defect clustering and defect likelihoods
    • Correlated to silicon DPPM
  • A way to report in public papers, and internal reports, the coverage achieved by new test and DfT techniques, to allow more objective comparison to other approaches
  • A basis for developing defect-oriented analog automatic test pattern generation (ATPG)
  • Analog defect injection and simulation definitions/rules which could be extended to multi-parameter variation defects in the future.

To view the submitted PAR to NESCOM of the IEEE, click here -> Link to P2427 PAR

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