Welcome to IEEE P1241
Sponsoring Society and Committee: IEEE Instrumentation and Measurement Society/ TC10 – Waveform Generation Measurement and Analysis (IM/WM&A)
Title: Standard for Terminology and Test Methods for Analog-to-Digital Converters
Scope: The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.
Nicholas Paulter, firstname.lastname@example.org
Luca De Vito, email@example.com
IEEE Program Coordinator
Patrycja Jarosz, firstname.lastname@example.org