Instrumentation and Measurement/Waveform Generation, Measurement, and Analysis – Technical Committee 10 (IM/WM&A – TC10)

The TC10 scope covers the science, technology, and application of electronic instrumentation and electrical measurement. TC10 is actively revising two of its standards for electric components:

• IEEE P1241^TM – Standard for Terminology and Test Methods for Analog-to-Digital Converters      (1241 Working Group Website)
• IEEE P1658^TM – Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices (1658 Working Group Website)

The revision of two other standards is pending a formal announcement and kick-off meeting:

• IEEE 181-2011^TM –  IEEE Standard for Transitions, Pulses, and Related Waveforms                      (181 Working Group Website)
• IEEE 1696-2013^TM –  IEEE Standard for Terminology and Test Methods for Circuit Probes            (1696 Working Group Website)

For your reference, the IEEE Instrumentation and Measurement Society TC10 Waveform Generation and Measurement Standards Committee has developed, published, and maintains the standards listed below:

• IEEE 1241-2010^TM –  IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
• IEEE 181-2011^TM –  IEEE Standard for Transitions, Pulses, and Related Waveforms
• IEEE 1658-2011^TM –  IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
• IEEE 1696-2013^TM –  IEEE Standard for Terminology and Test Methods for Circuit Probes
• IEEE 1057-2017^TM –  IEEE Standard for Digitizing Waveform Recorders
• IEEE P2414TM – Standard for Jitter and Phase Noise (NEW)

If you are interested in participating in the Standards Committee, please send an email to: IM-WMA-TC10-OFFICERS@LISTSERV.IEEE.ORG.

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