Welcome to IEEE P1658
Sponsoring Society and Committee: IEEE Instrumentation and Measurement Society/ TC10 – Waveform Generation Measurement and Analysis (IM/WM&A)
Title: Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
Scope: This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
WG Officers
Chair
Luca De Vito, devito@unisannio.it
Secretary
John Jendzurski, john.jendzurski@nist.gov
IEEE Program Coordinator
Patrycja Jarosz, p.jarosz@ieee.org