Sarson_Use_Models_for_Ext – ams & AMD – Through four use cases, we describe how IEEE 1687 can be extended to handle analog chips, including enhancements to ICL and PDL to facilitate the description of the components and actions involved in analog tests.
Laisne_Single-Pin_Test_Co – Dialog Semiconductor – The paper presents a unique single-wire P1687.1 like input developed by the authors for purposes of design for test. The paper will show how the wire was implemented in silicon and show actual test results.
ETS16_vStaudt – Dialog Semiconductor
vts16_S7C_P2 – AMD
APDL_vts17_rearick – AMD
1687 standard– IEEE
ETS 2015 IStream presentation sunter – Mentor