Welcome to IEEE P1696 - Probe Standards Working Group
Sponsoring Society and Committee: IEEE Instrumentation and Measurement Society/TC10 – Waveform Generation Measurement and Analysis (IM/WM&A)
Title: Standard for Terminology and Test Methods for Circuit Probes
Scope: This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.
John Jendzurski, firstname.lastname@example.org
Sergio Rapuano, email@example.com
IEEE SA Program Coordinator
Patrycja Jarosz, firstname.lastname@example.org