SCC20 – Test and Diagnosis for Electronic Systems

IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems

Scope:

Provides for the management, development, and maintenance of language and interface standards supporting system-level (onboard and off-board) automatic test and diagnosis. These standards include (but are not limited to) test requirements, test programs, test procedures, diagnostic knowledge, maintenance information, and major hardware subsystem interfaces between and within Automatic Test Systems.

In the News:

National Security Depends on Standards – By Mike Seavey, chair, IEEE Standards Coordinating Committee 20, engineering program manager, Northrop Grumman Corporation

SCC20 Officers