IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems
The IEEE has been monitoring the developing Coronavirus outbreak.
The safety and well-being of all conference participants is our priority. After studying and evaluating the announcements, guidance, and news released by relevant national departments, we are sorry to announce that the SCC20 20-1 meeting, scheduled to be held April 29-30 in North Reading Massachusetts USA has been cancelled.
Again, we apologize for any inconvenience this has caused and please contact Mike Seavey, phone: 224-625-4696, email: Michael.firstname.lastname@example.org with any questions you may have.
We look forward to welcoming you to the SCC20 20-2 meeting (Meeting Dates and Location are in being finalized).
Provides for the management, development, and maintenance of language and interface standards supporting system-level (onboard and off-board) automatic test and diagnosis. These standards include (but are not limited to) test requirements, test programs, test procedures, diagnostic knowledge, maintenance information, and major hardware subsystem interfaces between and within Automatic Test Systems.
In the News:
National Security Depends on Standards – By Mike Seavey, chair, IEEE Standards Coordinating Committee 20, engineering program manager, Northrop Grumman Corporation
Mike Seavey – Northrop Grumman (email@example.com)
Chris Gorringe – Spherea Technology (Chris.Gorringe@Spherea.co.uk)
Teresa Lopes – Teradyne (firstname.lastname@example.org)
Christy Bahn – IEEE (email@example.com)
There are no upcoming events at this time.