SCC20 - Test and Diagnosis for Electronic Systems
10:00AM – 11:00AM P1871.3 Working Group Meeting
Using JavaScript Object Notation (JSON) with
XML-based Data Models
11:00AM – Noon P2848 Working Group Meeting (potentially)
Prognostics and Health Management in
Automatic Test Systems
1:30PM – 3:30PM Study Group Meeting
ATML-compatible representation in SysML of test
requirements information for electronic systems.
3:30PM – 4:00PM P1671 Working Group Meeting
Automatic Test Markup Language (ATML)
Microsoft Teams meeting
Join on your computer, mobile app or room device
Meeting ID: 293 053 918 821
Passcode: yL8bRw
Join with a video conferencing device
Video Conference ID: 116 655 279 3
Or call in (audio only)
+1 929-352-1550,,35426298# United States, New York City
Phone Conference ID: 354 262 98#