Agenda (draft) – October 18th, 2023
Updated October 17th, 2023
1 Call to order, Chair’s remarks
To include:
2 Approval of the agenda
3 Approval of minutes of previous meetings
3.1 Regular meeting, July 19th, 2023.
The draft minutes are available on the IEEE TTSC iMeet site. (ref)
4 Action items review
Action | Who | When | |
1 | Create “cookbook” for how to startup a new (or revision) project/ working group. | Ian McIntosh | Forthwith |
2 | Submit PAR extension request for P2427 to NesCom | Ian McIntosh | Forthwith |
3 | Submit PAR for CITR to NesCom for Standard for Chiplet Interconnect Test and Repair. | Ian McIntosh | Forthwith |
4 | Request Language Subcommittee report from Deepak Asnani. | Ian McIntosh | Forthwith |
5 Technical Topics
5.1 Standards Committee action requested/required
- None
5.2 Regular order
5.2.1 Election review
Status reports
- P2654 (Rearick/Doege)
- P2929 (Ehrenberg)
- P1581 (Ehrenberg)
Elections due by next meeting
- P1149.4
- P2427
5.2.2 Status of projects in active development
All WG chairs: Please provide reports 7 days prior to the meeting using the standard reporting form (ref) and upload to Meeting Materials/Meeting_2023.10. Discussion by exception.
5.2.2.1 New projects starting up
- 1149.6 study group (Shaikh)
- P1450.6 working group (Cron)
- P3405 working group (transition from study group) (Chakravarty)
5.2.3 Maintenance review
- Without SC action, the following standards will expire at the end of 2027:
- 1149.10 C/TT/HJTAG
Standard for High Speed Test Access Port and On-chip Distribution Architecture - 1450.4 C/TT/P1450.4
Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification - 1804 C/TT/FACR 1804
Standard for Fault Accounting and Coverage Reporting (FACR) for Digital Modules
- 1149.10 C/TT/HJTAG
6 New Business
7 Subcommittee reports
7.1 Language Subcommittee
8 Items reported out of executive session
9 Any other business
10 New action items
11 Next meeting
The next meeting is proposed for January 17th, 2024