The goal of Working Group 1696 (formerly the Subcommittee on Probe Standards, SCOPS) is to develop documentary standards for characterizing the performance of electrical circuit probes and probe systems, where these systems may include waveform acquisition hardware and software and signal/waveform analysis software, and the probe will include the mechanism by which the circuit is contacted.
Published Standards:
- IEEE Std 1696-2013 – IEEE Standard for Terminology and Test Methods for Circuit Probes
Status: Active – Approved
Active Projects: (kick-off meeting not held)
- Project 1696 (P1696), revision to IEEE Std 1696-2013
- Title: Standard for Terminology and Test Methods for Circuit Probes
Scope: This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.
PAR Approval Date: 09-Feb-2021
PAR Expiration Date: 31-Dec-2025
Project Authorization Request (PAR) P1696