The goal of the ADC Subcommittee is to promote and facilitate accurate analysis, characterization, and communication of the performance of analog-to-digital converters (ADCs) through the development and maintenance of the IEEE Standard 1241, “IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters.” This standard provides a basis for evaluating, comparing, and procuring existing ADCs as well as supporting the advancement of ADC technology and design.
- IEEE Std 1241-2010 – IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
Status: Active – Approved
- Project 1241 (P1241), revision to IEEE Std 1241-2010
Title: Standard for Terminology and Test Methods for Analog-to-Digital Converters
Scope: The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate.
Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.
PAR Approval Date: 30-Jun-2016
PAR Expiration Date: 31-Dec-2020
Project Authorization Requests (PAR) 1241